Probe #0b6699ecd2 of Lenovo B590 20206
Log: smartctl
/dev/sda
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.74-generic-2rosa2021.1-x86_64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SandForce Driven SSDs
Device Model: TS128GSSD320
Serial Number: --
LU WWN Device Id: 0 0232d0 ...
Firmware Version: 5.0.6
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS, ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Oct 27 09:02:28 2021 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Disabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 48) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0021) SCT Status supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 102 102 050 - 0/5991610
5 Retired_Block_Count PO--CK 100 100 003 - 0
9 Power_On_Hours_and_Msec -O--CK 077 077 000 - 20172h+31m+13.560s
12 Power_Cycle_Count -O--CK 093 093 000 - 7474
171 Program_Fail_Count -O--CK 000 000 000 - 0
172 Erase_Fail_Count -O--CK 000 000 000 - 0
174 Unexpect_Power_Loss_Ct ----CK 000 000 000 - 83
177 Wear_Range_Delta ------ 000 000 000 - 7
181 Program_Fail_Count -O--CK 000 000 000 - 0
182 Erase_Fail_Count -O--CK 000 000 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 044 095 000 - 44 (Min/Max 1/95)
195 ECC_Uncorr_Error_Count --SRC- 120 120 000 - 0/5991610
196 Reallocated_Event_Count PO--CK 100 100 003 - 0
201 Unc_Soft_Read_Err_Rate --SRC- 120 120 000 - 0/5991610
204 Soft_ECC_Correct_Rate --SRC- 120 120 000 - 0/5991610
230 Life_Curve_Status PO--C- 100 100 000 - 100
231 SSD_Life_Left PO--C- 099 099 010 - 0
233 SandForce_Internal ------ 000 000 000 - 16023
234 SandForce_Internal -O--CK 000 000 000 - 11444
241 Lifetime_Writes_GiB -O--CK 000 000 000 - 11444
242 Lifetime_Reads_GiB -O--CK 000 000 000 - 9975
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x04 GPL,SL R/O 1 Device Statistics log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb7 GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log not supported
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
Device State: Active (0)
Current Temperature: 44 Celsius
Power Cycle Min/Max Temperature: 31/45 Celsius
Lifetime Min/Max Temperature: 1/95 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 10 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 4/115 Celsius
Min/Max Temperature Limit: 112/-90 Celsius
Temperature History Size (Index): 12373 (161)
Invalid Temperature History Size or Index
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 7475 --- Lifetime Power-On Resets
0x01 0x010 4 20172 --- Power-on Hours
0x01 0x018 6 24001444605 --- Logical Sectors Written
0x01 0x028 6 20919481574 --- Logical Sectors Read
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 33452 --- Resets Between Cmd Acceptance and Completion
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 33452 --- Number of Hardware Resets
0x06 0x010 4 12745 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 255 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 24 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 23 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
0x0002 2 0 R_ERR response for data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS