/dev/sda === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint M Device Model: SAMSUNG MP0804H Serial Number: -- Firmware Version: UE100-21 User Capacity: 80 060 424 192 bytes [80,0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-7 T13/1532D revision 0 Local Time is: Tue Nov 29 16:31:58 2016 +05 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 3120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 52) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 099 051 - 0 3 Spin_Up_Time POS--- 100 100 025 - 3136 4 Start_Stop_Count -O--CK 097 097 000 - 3391 5 Reallocated_Sector_Ct PO--CK 253 253 011 - 0 7 Seek_Error_Rate -OSR-- 253 253 000 - 0 8 Seek_Time_Performance --S--K 253 253 000 - 0 9 Power_On_Half_Minutes -O--CK 099 099 000 - 6027h+46m 10 Spin_Retry_Count -O--CK 253 253 001 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 1855 191 G-Sense_Error_Rate -O--C- 001 001 000 - 13349121 194 Temperature_Celsius -O---K 109 031 000 - 43 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 2661070 196 Reallocated_Event_Count -O--CK 253 253 000 - 0 197 Current_Pending_Sector -O--C- 253 253 000 - 0 198 Offline_Uncorrectable ----CK 253 253 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate -O-R-- 100 100 051 - 0 201 Soft_Read_Error_Rate -O--C- 253 253 000 - 0 223 Load_Retry_Count -O--C- 097 097 000 - 3276 225 Load_Cycle_Count -O--C- 048 048 000 - 528889 255 Unknown_Attribute -O-R-- 100 100 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x06 SL R/O 2 SMART self-test log 0x80-0x9f SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 172 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 172 occurred at disk power-on lifetime: 5931 hours (247 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 66 6e 24 e0 Error: UNC 8 sectors at LBA = 0x00246e66 = 2387558 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 66 6e 24 e0 00 17:03:58.938 READ DMA ca 00 0f 5e 26 84 e8 00 17:03:58.938 WRITE DMA c8 00 08 16 d9 60 e0 00 17:03:58.938 READ DMA c8 00 08 c6 c8 60 e0 00 17:03:58.938 READ DMA c8 00 08 96 4f 60 e0 00 17:03:58.938 READ DMA Error 171 occurred at disk power-on lifetime: 5931 hours (247 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 4e 6e 24 e0 Error: UNC 32 sectors at LBA = 0x00246e4e = 2387534 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 4e 6e 24 e0 00 17:03:56.938 READ DMA ca 00 20 0e b7 bc e4 00 17:03:56.938 WRITE DMA ca 00 20 6e a8 bc e4 00 17:03:56.938 WRITE DMA c8 00 08 6e 2d 82 e0 00 17:03:56.938 READ DMA c8 00 08 d6 85 81 e0 00 17:03:56.938 READ DMA Error 170 occurred at disk power-on lifetime: 5926 hours (246 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 66 6e 24 e0 Error: UNC 8 sectors at LBA = 0x00246e66 = 2387558 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 66 6e 24 e0 00 11:40:12.438 READ DMA c8 00 40 9e 34 0e e0 00 11:40:12.438 READ DMA c8 00 40 06 28 07 e0 00 11:40:12.438 READ DMA c8 00 08 5e 6e 24 e0 00 11:40:12.375 READ DMA c8 00 40 5e 34 0e e0 00 11:40:12.375 READ DMA Error 169 occurred at disk power-on lifetime: 5926 hours (246 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 4e 6e 24 e0 Error: UNC 32 sectors at LBA = 0x00246e4e = 2387534 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 20 4e 6e 24 e0 00 11:40:10.875 READ DMA c8 00 40 9e 33 0e e0 00 11:40:10.875 READ DMA c8 00 40 06 27 07 e0 00 11:40:10.875 READ DMA c8 00 40 5e 33 0e e0 00 11:40:10.875 READ DMA c8 00 08 26 60 02 e0 00 11:40:10.813 READ DMA Error 168 occurred at disk power-on lifetime: 5898 hours (245 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 7a 8e 69 89 e8 Error: UNC at LBA = 0x0889698e = 143223182 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 7a 8e 69 89 e8 00 01:53:48.563 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:53:48.563 READ DMA 40 00 7a c4 b4 4d e8 00 01:53:48.500 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:53:48.500 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported