/dev/sda === START OF INFORMATION SECTION === Model Family: Western Digital Protege Device Model: WDC WD200EB-00BHF0 Serial Number: -- Firmware Version: 15.15M15 User Capacity: 20 020 396 032 bytes [20,0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-5 (minor revision not indicated) Local Time is: Sun Dec 27 22:06:52 2015 NOVT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1400) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 22) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 200 200 051 - 0 3 Spin_Up_Time POS--- 114 111 021 - 1666 4 Start_Stop_Count -O--CK 098 098 040 - 2326 5 Reallocated_Sector_Ct -O--CK 200 200 112 - 0 7 Seek_Error_Rate PO-R-- 100 253 051 - 0 9 Power_On_Hours -O--CK 068 068 000 - 23827 10 Spin_Retry_Count PO--C- 100 100 051 - 1 11 Calibration_Retry_Count PO--C- 100 100 051 - 0 12 Power_Cycle_Count -O--CK 098 098 000 - 2144 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--C- 200 200 000 - 0 198 Offline_Uncorrectable -O--C- 200 200 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 7 200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning Read SMART Log Directory failed: scsi error badly formed scsi parameters ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: scsi error badly formed scsi parameters Read GP Log Directory failed SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported