/dev/sda === START OF INFORMATION SECTION === Device Model: P3-128 Serial Number: -- LU WWN Device Id: 5 000000 ... Firmware Version: T170810a User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-4 (minor revision not indicated) SATA Version is: SATA 3.2, 6.0 Gb/s (current: 1.5 Gb/s) Local Time is: Wed Apr 3 20:03:31 2024 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 33) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 66) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 100 100 000 - 41 12 Power_Cycle_Count -O--CK 100 100 000 - 208 167 Unknown_Attribute -O---K 100 100 000 - 0 168 Unknown_Attribute -O--CK 100 100 000 - 0 169 Unknown_Attribute -O--CK 097 097 010 - 262144 171 Unknown_Attribute -O--CK 000 000 000 - 0 172 Unknown_Attribute -O--CK 000 000 000 - 0 173 Unknown_Attribute -O--CK 200 200 000 - 12886409225 175 Program_Fail_Count_Chip -O---K 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 020 - 136 187 Reported_Uncorrect -O--CK 100 000 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 92 206 Unknown_SSD_Attribute -O--CK 200 200 000 - 3 207 Unknown_SSD_Attribute -O--CK 200 200 000 - 23 208 Unknown_SSD_Attribute -O--CK 200 200 000 - 9 231 Temperature_Celsius PO---K 100 100 005 - 0 241 Total_LBAs_Written -O--CK 100 100 000 - 1123775521 242 Total_LBAs_Read -O--CK 100 100 000 - 470342525 245 Unknown_Attribute -O--CK 100 100 000 - 6360637 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (64 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 40 Celsius Power Cycle Min/Max Temperature: ?/40 Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: -127/127 Celsius Min/Max Temperature Limit: -127/127 Celsius Temperature History Size (Index): 478 (48641) Invalid Temperature History Size or Index SCT Error Recovery Control: Read: 80 (8.0 seconds) Write: 80 (8.0 seconds) Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 4 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 2 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC