Probe #5732c16e87 of ASUSTek X450CC
Log: smartctl
/dev/sda
=== START OF INFORMATION SECTION ===
Model Family: Seagate Samsung SpinPoint M8 (AF)
Device Model: ST750LM022 HN-M750MBB
Serial Number: --
LU WWN Device Id: 5 0004cf ...
Firmware Version: 2AR20002
User Capacity: 750 156 374 016 bytes [750 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Aug 14 17:13:39 2017 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9600) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 160) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 051 - 6
2 Throughput_Performance -OS--K 252 252 000 - 0
3 Spin_Up_Time PO---K 090 089 025 - 3059
4 Start_Stop_Count -O--CK 099 099 000 - 1879
5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0
7 Seek_Error_Rate -OSR-K 252 252 051 - 0
8 Seek_Time_Performance --S--K 252 252 015 - 0
9 Power_On_Hours -O--CK 100 100 000 - 23070
10 Spin_Retry_Count -O--CK 252 252 051 - 0
12 Power_Cycle_Count -O--CK 099 099 000 - 1703
191 G-Sense_Error_Rate -O---K 100 100 000 - 149
192 Power-Off_Retract_Count -O---K 252 252 000 - 0
194 Temperature_Celsius -O---- 064 057 000 - 32 (Min/Max 9/43)
195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 252 252 000 - 0
197 Current_Pending_Sector -O--CK 252 252 000 - 0
198 Offline_Uncorrectable ----CK 252 252 000 - 0
199 UDMA_CRC_Error_Count -OS-CK 200 200 000 - 0
200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 7177
223 Load_Retry_Count -O--CK 100 100 000 - 924
225 Load_Cycle_Count -O--CK 055 055 000 - 463536
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 2 Comprehensive SMART error log
0x03 GPL R/O 2 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x08 GPL R/O 2 Power Conditions log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 SATA NCQ Queued Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xc0-0xdf GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 12071 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 31/34 Celsius
Lifetime Min/Max Temperature: 8/43 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 5 minutes
Temperature Logging Interval: 5 minutes
Min/Max recommended Temperature: -5/80 Celsius
Min/Max Temperature Limit: -10/85 Celsius
Temperature History Size (Index): 128 (104)
Index Estimated Time Temperature Celsius
105 2017-08-14 06:35 32 *************
106 2017-08-14 06:40 31 ************
... ..( 6 skipped). .. ************
113 2017-08-14 07:15 31 ************
114 2017-08-14 07:20 30 ***********
... ..( 4 skipped). .. ***********
119 2017-08-14 07:45 30 ***********
120 2017-08-14 07:50 31 ************
121 2017-08-14 07:55 31 ************
122 2017-08-14 08:00 31 ************
123 2017-08-14 08:05 30 ***********
124 2017-08-14 08:10 30 ***********
125 2017-08-14 08:15 31 ************
... ..( 27 skipped). .. ************
25 2017-08-14 10:35 31 ************
26 2017-08-14 10:40 35 ****************
27 2017-08-14 10:45 34 ***************
28 2017-08-14 10:50 34 ***************
29 2017-08-14 10:55 34 ***************
30 2017-08-14 11:00 33 **************
31 2017-08-14 11:05 34 ***************
32 2017-08-14 11:10 34 ***************
33 2017-08-14 11:15 33 **************
... ..( 5 skipped). .. **************
39 2017-08-14 11:45 33 **************
40 2017-08-14 11:50 32 *************
... ..( 2 skipped). .. *************
43 2017-08-14 12:05 32 *************
44 2017-08-14 12:10 31 ************
... ..( 58 skipped). .. ************
103 2017-08-14 17:05 31 ************
104 2017-08-14 17:10 32 *************
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x0007 4 0 R_ERR response for host-to-device non-data FIS
0x0008 4 0 Device-to-host non-data FIS retries
0x0009 4 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 5 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 4 0 R_ERR response for host-to-device data FIS, CRC
0x0010 4 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 4 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 4 0 R_ERR response for host-to-device non-data FIS, non-CRC
0x8e00 4 0 Vendor specific
0x8e01 4 0 Vendor specific
0x8e02 4 0 Vendor specific
0x8e03 4 0 Vendor specific
0x8e04 4 0 Vendor specific
0x8e05 4 0 Vendor specific
0x8e06 4 0 Vendor specific
0x8e07 4 0 Vendor specific
0x8e08 4 0 Vendor specific
0x8e09 4 0 Vendor specific
0x8e0a 4 0 Vendor specific
0x8e0b 4 0 Vendor specific
0x8e0c 4 0 Vendor specific
0x8e0d 4 0 Vendor specific
0x8e0e 4 0 Vendor specific
0x8e0f 4 0 Vendor specific
0x8e10 4 0 Vendor specific
0x8e11 4 0 Vendor specific