Probe #5732c16e87 of ASUSTek X450CC

Log: smartctl

/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Samsung SpinPoint M8 (AF) Device Model: ST750LM022 HN-M750MBB Serial Number: -- LU WWN Device Id: 5 0004cf ... Firmware Version: 2AR20002 User Capacity: 750 156 374 016 bytes [750 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Mon Aug 14 17:13:39 2017 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 9600) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 160) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 051 - 6 2 Throughput_Performance -OS--K 252 252 000 - 0 3 Spin_Up_Time PO---K 090 089 025 - 3059 4 Start_Stop_Count -O--CK 099 099 000 - 1879 5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0 7 Seek_Error_Rate -OSR-K 252 252 051 - 0 8 Seek_Time_Performance --S--K 252 252 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 23070 10 Spin_Retry_Count -O--CK 252 252 051 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 1703 191 G-Sense_Error_Rate -O---K 100 100 000 - 149 192 Power-Off_Retract_Count -O---K 252 252 000 - 0 194 Temperature_Celsius -O---- 064 057 000 - 32 (Min/Max 9/43) 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 252 252 000 - 0 197 Current_Pending_Sector -O--CK 252 252 000 - 0 198 Offline_Uncorrectable ----CK 252 252 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 200 200 000 - 0 200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 7177 223 Load_Retry_Count -O--CK 100 100 000 - 924 225 Load_Cycle_Count -O--CK 055 055 000 - 463536 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 2 Extended self-test log 0x08 GPL R/O 2 Power Conditions log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xc0-0xdf GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 12071 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 32 Celsius Power Cycle Min/Max Temperature: 31/34 Celsius Lifetime Min/Max Temperature: 8/43 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 5 minutes Temperature Logging Interval: 5 minutes Min/Max recommended Temperature: -5/80 Celsius Min/Max Temperature Limit: -10/85 Celsius Temperature History Size (Index): 128 (104) Index Estimated Time Temperature Celsius 105 2017-08-14 06:35 32 ************* 106 2017-08-14 06:40 31 ************ ... ..( 6 skipped). .. ************ 113 2017-08-14 07:15 31 ************ 114 2017-08-14 07:20 30 *********** ... ..( 4 skipped). .. *********** 119 2017-08-14 07:45 30 *********** 120 2017-08-14 07:50 31 ************ 121 2017-08-14 07:55 31 ************ 122 2017-08-14 08:00 31 ************ 123 2017-08-14 08:05 30 *********** 124 2017-08-14 08:10 30 *********** 125 2017-08-14 08:15 31 ************ ... ..( 27 skipped). .. ************ 25 2017-08-14 10:35 31 ************ 26 2017-08-14 10:40 35 **************** 27 2017-08-14 10:45 34 *************** 28 2017-08-14 10:50 34 *************** 29 2017-08-14 10:55 34 *************** 30 2017-08-14 11:00 33 ************** 31 2017-08-14 11:05 34 *************** 32 2017-08-14 11:10 34 *************** 33 2017-08-14 11:15 33 ************** ... ..( 5 skipped). .. ************** 39 2017-08-14 11:45 33 ************** 40 2017-08-14 11:50 32 ************* ... ..( 2 skipped). .. ************* 43 2017-08-14 12:05 32 ************* 44 2017-08-14 12:10 31 ************ ... ..( 58 skipped). .. ************ 103 2017-08-14 17:05 31 ************ 104 2017-08-14 17:10 32 ************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0003 4 0 R_ERR response for device-to-host data FIS 0x0004 4 0 R_ERR response for host-to-device data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x0006 4 0 R_ERR response for device-to-host non-data FIS 0x0007 4 0 R_ERR response for host-to-device non-data FIS 0x0008 4 0 Device-to-host non-data FIS retries 0x0009 4 8 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 5 Device-to-host register FISes sent due to a COMRESET 0x000b 4 0 CRC errors within host-to-device FIS 0x000d 4 0 Non-CRC errors within host-to-device FIS 0x000f 4 0 R_ERR response for host-to-device data FIS, CRC 0x0010 4 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 4 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 4 0 R_ERR response for host-to-device non-data FIS, non-CRC 0x8e00 4 0 Vendor specific 0x8e01 4 0 Vendor specific 0x8e02 4 0 Vendor specific 0x8e03 4 0 Vendor specific 0x8e04 4 0 Vendor specific 0x8e05 4 0 Vendor specific 0x8e06 4 0 Vendor specific 0x8e07 4 0 Vendor specific 0x8e08 4 0 Vendor specific 0x8e09 4 0 Vendor specific 0x8e0a 4 0 Vendor specific 0x8e0b 4 0 Vendor specific 0x8e0c 4 0 Vendor specific 0x8e0d 4 0 Vendor specific 0x8e0e 4 0 Vendor specific 0x8e0f 4 0 Vendor specific 0x8e10 4 0 Vendor specific 0x8e11 4 0 Vendor specific


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