/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST3200822AS Serial Number: -- Firmware Version: 3.01 User Capacity: 200 046 468 608 bytes [200 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 2 Local Time is: Wed Feb 15 10:05:03 2017 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 049 046 006 - 197961639 3 Spin_Up_Time PO---- 097 096 000 - 0 4 Start_Stop_Count -O--CK 092 092 020 - 8836 5 Reallocated_Sector_Ct PO--CK 099 099 036 - 65 7 Seek_Error_Rate POSR-- 074 060 030 - 26509725 9 Power_On_Hours -O--CK 079 079 000 - 18441 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 091 091 020 - 9475 194 Temperature_Celsius -O---K 049 066 000 - 49 195 Hardware_ECC_Recovered -O-RC- 049 045 000 - 197961639 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 199 000 - 5 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 096 249 000 - 4 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log 0xb0 SL VS 1 Device vendor specific log 0xb4 SL VS 4 Device vendor specific log 0xbe-0xbf SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 18 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 18 occurred at disk power-on lifetime: 16620 hours (692 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 00 7f d9 49 40 Error: IDNF at LBA = 0x0049d97f = 4839807 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 35 ff 40 40 d9 49 40 00 01:38:21.048 WRITE DMA EXT 35 ff 40 00 d9 49 40 00 01:38:21.047 WRITE DMA EXT 35 ff 40 c0 d8 49 40 00 01:38:21.045 WRITE DMA EXT 35 ff 40 80 d8 49 40 00 01:38:21.044 WRITE DMA EXT 35 ff 40 40 d8 49 40 00 01:38:21.043 WRITE DMA EXT Error 17 occurred at disk power-on lifetime: 15389 hours (641 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 04 3b 38 cf e0 Error: UNC 4 sectors at LBA = 0x00cf383b = 13580347 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 37 38 cf e0 00 00:25:25.474 READ DMA EXT 35 00 08 0f 8d 60 e0 00 00:25:25.473 WRITE DMA EXT 25 00 08 2f 38 cf e0 00 00:25:25.473 READ DMA EXT 35 00 08 c7 8c 60 e0 00 00:25:25.472 WRITE DMA EXT ea 00 00 00 00 00 a0 00 00:25:32.162 FLUSH CACHE EXT Error 16 occurred at disk power-on lifetime: 15389 hours (641 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 09 38 38 cf e0 Error: UNC 9 sectors at LBA = 0x00cf3838 = 13580344 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 20 2f 38 cf e0 00 00:25:25.474 READ DMA EXT 35 00 08 57 3b 5e e0 00 00:25:25.473 WRITE DMA EXT 35 00 28 df 3f 5f e0 00 00:25:25.473 WRITE DMA EXT 35 00 20 af 4a 00 e0 00 00:25:25.472 WRITE DMA EXT 35 00 20 6f 6c 6e e0 00 00:25:23.439 WRITE DMA EXT Error 15 occurred at disk power-on lifetime: 14656 hours (610 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 38 97 22 71 e0 Error: UNC 56 sectors at LBA = 0x00712297 = 7414423 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 5f 22 71 e0 00 00:00:26.573 READ DMA EXT 25 00 00 5f 21 71 e0 00 00:00:26.572 READ DMA EXT 25 00 00 5f 20 71 e0 00 00:00:26.570 READ DMA EXT 25 00 00 5f 1f 71 e0 00 00:00:26.563 READ DMA EXT 25 00 00 5f 1e 71 e0 00 00:00:26.561 READ DMA EXT Error 14 occurred at disk power-on lifetime: 8921 hours (371 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 a8 31 51 e0 Error: UNC at LBA = 0x005131a8 = 5321128 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 a8 31 51 e0 00 05:31:52.046 READ DMA EXT 35 00 07 08 46 1e e0 00 05:31:52.046 WRITE DMA EXT 35 00 07 80 9e 0b e0 00 05:31:52.033 WRITE DMA EXT 35 00 01 a8 5c 0a e0 00 05:31:52.032 WRITE DMA EXT 25 00 08 a0 eb 74 e0 00 05:31:52.032 READ DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported