/dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-5.15.52-gentoo] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SanDisk SD8TN8U512G1001 Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: X4133101 User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5405 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 30 08:34:37 2022 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 4 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 --- - 0 9 Power_On_Hours -O--CK 100 100 --- - 7194 12 Power_Cycle_Count -O--CK 100 100 --- - 1233 170 Unknown_Attribute -O--CK 100 100 --- - 0 171 Unknown_Attribute -O--CK 100 100 --- - 0 172 Unknown_Attribute -O--CK 100 100 --- - 0 173 Unknown_Attribute -O--CK 100 100 --- - 3 174 Unknown_Attribute -O--CK 100 100 --- - 157 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 --- - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 100 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Reported_Uncorrect -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 055 074 --- - 45 (Min/Max 12/74) 199 UDMA_CRC_Error_Count -O--CK 100 100 --- - 0 233 Media_Wearout_Indicator PO--CK 098 100 001 - 16303183 234 Unknown_Attribute -O--CK 100 100 --- - 8163 241 Total_LBAs_Written ----CK 253 253 --- - 6080 242 Total_LBAs_Read ----CK 253 253 --- - 12502 249 Unknown_Attribute -O--CK 100 100 --- - 1792 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log 0xdf GPL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 1233 --- Lifetime Power-On Resets 0x01 0x010 4 101 --- Power-on Hours 0x01 0x018 6 12750946511 --- Logical Sectors Written 0x01 0x020 6 261119784 --- Number of Write Commands 0x01 0x028 6 26218711866 --- Logical Sectors Read 0x01 0x030 6 1064956630 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 4 Device-to-host register FISes sent due to a COMRESET