/dev/sda smartctl 7.4 2023-08-01 r5530 [i686-linux-6.6.56-0-lts] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Travelstar 5K250 Device Model: Hitachi HTS542516K9SA00 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: BBCOC31P User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5528 ATA Version is: ATA8-ACS T13/1699-D revision 3f SATA Version is: SATA 2.5, 1.5 Gb/s Local Time is: Sat Oct 12 10:22:17 2024 +05 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unknown === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 75) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0 2 Throughput_Performance P-S--- 100 100 040 - 0 3 Spin_Up_Time POS--- 253 253 033 - 1 4 Start_Stop_Count -O--C- 096 096 000 - 6777 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 100 100 040 - 0 9 Power_On_Hours -O--C- 092 092 000 - 3845 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 098 098 000 - 3437 191 G-Sense_Error_Rate -O-R-- 100 100 000 - 1 192 Power-Off_Retract_Count -O--CK 100 100 000 - 51 193 Load_Cycle_Count -O--C- 094 094 000 - 65569 194 Temperature_Celsius -O---- 137 137 000 - 40 (Min/Max 7/56) 196 Reallocated_Event_Count -O--CK 100 100 000 - 10 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0 223 Load_Retry_Count -O-R-- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 2 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 [1] occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 10 -- 51 00 01 00 00 12 a1 c9 81 e0 00 Error: IDNF 1 sectors at LBA = 0x12a1c981 = 312592769 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 20 20 00 01 00 00 12 a1 c9 81 e0 08 00:00:34.300 READ DMA EXT 35 20 20 00 01 00 00 00 00 00 00 e0 08 00:00:34.300 WRITE DMA EXT 25 20 20 00 01 00 00 00 00 00 00 e0 08 00:00:34.300 READ DMA EXT 25 20 20 00 01 00 00 00 00 00 00 e0 08 00:00:34.300 READ DMA EXT 25 20 20 00 01 00 00 00 00 00 00 e0 08 00:00:34.300 READ DMA EXT Error 1 [0] occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 10 -- 51 00 01 00 00 12 a1 c9 81 e0 00 Error: IDNF 1 sectors at LBA = 0x12a1c981 = 312592769 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 20 20 00 01 00 00 12 a1 c9 81 e0 08 00:00:34.200 READ DMA EXT 25 20 20 00 01 00 00 00 00 56 3d e0 08 00:00:34.200 READ DMA EXT 25 20 20 00 01 00 00 00 00 56 3c e0 08 00:00:34.200 READ DMA EXT 25 20 20 00 01 00 00 00 00 56 3b e0 08 00:00:34.200 READ DMA EXT 25 20 20 00 01 00 00 00 00 56 3a e0 08 00:00:34.200 READ DMA EXT SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 40 Celsius Power Cycle Min/Max Temperature: 24/40 Celsius Lifetime Min/Max Temperature: 7/56 Celsius Specified Max Operating Temperature: 44 Celsius Under/Over Temperature Limit Count: 0/0 Unexpected SCT status 0x0000 (action_code=5, function_code=0) Read SCT Temperature History failed SMART WRITE LOG does not return COUNT and LBA_LOW register SCT (Get) Error Recovery Control command failed Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 0 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS