Probe #afe9d3f758 of ASUSTek B85M-G Desktop Computer (All Series)

Log: smartctl

/dev/sda === START OF INFORMATION SECTION === Model Family: SanDisk based SSDs Device Model: SanDisk SSD U110 64GB Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: U221000 User Capacity: 63,023,063,040 bytes [63.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu May 23 22:32:17 2019 +07 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 11) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 5343 12 Power_Cycle_Count -O---- 100 100 000 - 2396 165 Total_Write/Erase_Count -O---- 100 100 000 - 323856 171 Program_Fail_Count -O---- 100 100 000 - 0 172 Erase_Fail_Count -O---- 100 100 000 - 0 173 Avg_Write/Erase_Count -O---- 100 100 000 - 82 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 353 187 Reported_Uncorrect -O---- 100 100 000 - 0 194 Temperature_Celsius -O---K 070 030 000 - 30 (Min/Max 3/48) 230 Perc_Write/Erase_Count -O---- 100 100 000 - 273 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 466 241 Total_LBAs_Written -O---- 100 100 000 - 10214431037 242 Total_LBAs_Read -O---- 100 100 000 - 11019550197 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 4558 - # 2 Short offline Completed without error 00% 4464 - # 3 Short offline Completed without error 00% 2522 - # 4 Short offline Aborted by host 70% 463 - # 5 Extended offline Completed without error 00% 2 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 30 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 48 --- Highest Temperature 0x05 0x028 1 16 --- Lowest Temperature 0x05 0x030 1 38 --- Highest Average Short Term Temperature 0x05 0x038 1 38 --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 2 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 12 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error /dev/sdb === START OF INFORMATION SECTION === Device Model: TOSHIBA THNSNH060GCST Serial Number: -- LU WWN Device Id: 5 00080d ... Firmware Version: HTGAN102 User Capacity: 60,022,480,896 bytes [60.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu May 23 22:32:17 2019 +07 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 16) The self-test routine was aborted by the host. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 4) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0 2 Throughput_Performance P-S--- 100 100 050 - 0 3 Spin_Up_Time POS--- 100 100 050 - 0 5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0 7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0 8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0 9 Power_On_Hours -O--C- 100 100 000 - 11231 10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0 12 Power_Cycle_Count -O--C- 100 100 000 - 4026 167 Unknown_Attribute -O---K 100 100 000 - 0 168 Unknown_Attribute -O--C- 100 100 000 - 0 169 Unknown_Attribute PO--C- 100 100 010 - 100 170 Unknown_Attribute PO--C- 100 100 010 - 0 173 Unknown_Attribute -O--C- 183 183 000 - 11068169789218 174 Unknown_Attribute -O--C- 198 198 000 - 2207620921085 175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 192 Power-Off_Retract_Count -O--C- 100 100 000 - 430 194 Temperature_Celsius -O---K 070 046 000 - 30 (Min/Max 11/54) 197 Current_Pending_Sector -O--C- 100 100 000 - 0 240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0 241 Total_LBAs_Written -O--C- 100 100 000 - 241601 242 Total_LBAs_Read -O--C- 100 100 000 - 248303 243 Unknown_Attribute -O--C- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (64 sectors) Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] occurred at disk power-on lifetime: 2080 hours (86 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 00 00 00 05 e9 1d 38 40 00 Error: ICRC, ABRT at LBA = 0x05e91d38 = 99163448 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 61 00 08 00 00 00 00 05 e9 1d 38 40 00 00:51:08.179 WRITE FPDMA QUEUED 61 00 08 00 00 00 00 05 e9 1d 30 40 00 00:51:08.179 WRITE FPDMA QUEUED 61 00 08 00 00 00 00 05 e9 1d 28 40 00 00:51:08.178 WRITE FPDMA QUEUED 61 00 08 00 00 00 00 05 e9 1d 20 40 00 00:51:08.178 WRITE FPDMA QUEUED 61 00 08 00 00 00 00 05 e9 1d 18 40 00 00:51:08.178 WRITE FPDMA QUEUED SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Aborted by host 00% 3384 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 3 (0x0003) SCT Support Level: 0 Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 23/30 Celsius Lifetime Min/Max Temperature: 11/54 Celsius Under/Over Temperature Limit Count: 0/0 Vendor specific: 00 00 04 00 05 01 00 05 05 00 00 00 00 00 00 00 00 01 00 00 f1 ef 68 02 01 01 00 00 00 00 00 05 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 5/40 Celsius Min/Max Temperature Limit: 0/80 Celsius Temperature History Size (Index): 128 (60) Index Estimated Time Temperature Celsius 61 2019-05-23 20:25 30 *********** ... ..( 9 skipped). .. *********** 71 2019-05-23 20:35 30 *********** 72 2019-05-23 20:36 29 ********** 73 2019-05-23 20:37 30 *********** 74 2019-05-23 20:38 29 ********** ... ..( 5 skipped). .. ********** 80 2019-05-23 20:44 29 ********** 81 2019-05-23 20:45 30 *********** ... ..( 17 skipped). .. *********** 99 2019-05-23 21:03 30 *********** 100 2019-05-23 21:04 ? - 101 2019-05-23 21:05 ? - 102 2019-05-23 21:06 24 ***** 103 2019-05-23 21:07 25 ****** 104 2019-05-23 21:08 25 ****** 105 2019-05-23 21:09 26 ******* 106 2019-05-23 21:10 26 ******* 107 2019-05-23 21:11 27 ******** ... ..( 3 skipped). .. ******** 111 2019-05-23 21:15 27 ******** 112 2019-05-23 21:16 28 ********* ... ..( 12 skipped). .. ********* 125 2019-05-23 21:29 28 ********* 126 2019-05-23 21:30 29 ********** ... ..( 22 skipped). .. ********** 21 2019-05-23 21:53 29 ********** 22 2019-05-23 21:54 30 *********** ... ..( 37 skipped). .. *********** 60 2019-05-23 22:32 30 *********** SCT Error Recovery Control: Read: 600 (60.0 seconds) Write: 600 (60.0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 4026 --- Lifetime Power-On Resets 0x01 0x018 6 15833576293 --- Logical Sectors Written 0x01 0x020 6 198100281 --- Number of Write Commands 0x01 0x028 6 16272831844 --- Logical Sectors Read 0x01 0x030 6 269390006 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 30 --- Current Temperature 0x05 0x010 1 34 --- Average Short Term Temperature 0x05 0x018 1 37 --- Average Long Term Temperature 0x05 0x020 1 51 --- Highest Temperature 0x05 0x028 1 20 --- Lowest Temperature 0x05 0x030 1 46 --- Highest Average Short Term Temperature 0x05 0x038 1 28 --- Lowest Average Short Term Temperature 0x05 0x040 1 38 --- Highest Average Long Term Temperature 0x05 0x048 1 32 --- Lowest Average Long Term Temperature 0x05 0x050 4 111610 --- Time in Over-Temperature 0x05 0x058 1 40 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 5 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 19834 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 17 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 4 11 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 12 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC


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