Probe #c644f80930 of Dell Inspiron 3521

Log: smartctl

/dev/sda smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.0.0-3-amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Marvell based SanDisk SSDs Device Model: SanDisk SSD PLUS 120 GB Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: UE3600RL User Capacity: 120,040,980,480 bytes [120 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Nov 13 07:54:03 2022 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 32) The self-test routine was interrupted by the host with a hard or soft reset. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x15) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 21) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0 9 Power_On_Hours -O--CK 100 100 000 - 6807 12 Power_Cycle_Count -O--CK 100 100 000 - 1538 165 Total_Write/Erase_Count -O--CK 100 100 000 - 2934 166 Min_W/E_Cycle -O--CK 100 100 --- - 42 167 Min_Bad_Block/Die -O--CK 100 100 --- - 0 168 Maximum_Erase_Cycle -O--CK 100 100 --- - 46 169 Total_Bad_Block -O--CK 100 100 --- - 87 170 Unknown_Marvell_Attr -O--CK 100 100 --- - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Avg_Write/Erase_Count -O--CK 100 100 000 - 42 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 296 184 End-to-End_Error -O--CK 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 188 Command_Timeout -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 074 050 000 - 26 (Min/Max 0/50) 199 SATA_CRC_Error -O--CK 100 100 --- - 0 230 Perc_Write/Erase_Count -O--CK 100 100 000 - 2086 2088 2086 232 Perc_Avail_Resrvd_Space PO--CK 100 100 005 - 100 233 Total_NAND_Writes_GiB -O--CK 100 100 --- - 5025 234 Perc_Write/Erase_Ct_BC -O--CK 100 100 000 - 16325 241 Total_Writes_GiB ----CK 100 100 000 - 6465 242 Total_Reads_GiB ----CK 100 100 000 - 6374 244 Thermal_Throttle -O--CK 000 100 --- - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa7 GPL,SL VS 1 Device vendor specific log 0xa9 GPL,SL VS 3 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 6801 - # 2 Short offline Completed without error 00% 2684 - # 3 Short offline Self-test routine in progress 80% 2684 - # 4 Short offline Completed without error 00% 1060 - # 5 Short offline Completed without error 00% 31 - Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 1538 --- Lifetime Power-On Resets 0x01 0x010 4 6807 --- Power-on Hours 0x01 0x018 6 13558336435 --- Logical Sectors Written 0x01 0x028 6 13369035429 --- Logical Sectors Read 0x01 0x038 6 6807 --- Date and Time TimeStamp 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 26 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 50 --- Highest Temperature 0x05 0x028 1 19 --- Lowest Temperature 0x05 0x030 1 42 --- Highest Average Short Term Temperature 0x05 0x038 1 42 --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 8 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 9390 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 25 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error


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