/dev/sda === START OF INFORMATION SECTION === Model Family: Hitachi Deskstar P7K500 Device Model: Hitachi HDP725032GLA380 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: GM3OA52A User Capacity: 320 072 933 376 bytes [320 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 7200 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Wed Dec 21 21:30:03 2016 CXT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM level is: 254 (maximum performance), recommended: 128 APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 5908) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 98) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 016 - 0 2 Throughput_Performance P-S--- 128 128 054 - 163 3 Spin_Up_Time POS--- 115 115 024 - 332 (Average 333) 4 Start_Stop_Count -O--C- 099 099 000 - 6072 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 131 131 020 - 29 9 Power_On_Hours -O--C- 097 097 000 - 23891 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 5848 192 Power-Off_Retract_Count -O--CK 095 095 000 - 6131 193 Load_Cycle_Count -O--C- 095 095 000 - 6131 194 Temperature_Celsius -O---- 162 162 000 - 37 (Min/Max 6/48) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x20 GPL R/O 1 Streaming performance log [OBS-8] 0x21 GPL R/O 1 Write stream error log 0x22 GPL R/O 1 Read stream error log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 366 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 366 [1] occurred at disk power-on lifetime: 3572 hours (148 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 06 00 00 12 ef c1 b2 e2 00 Error: UNC 6 sectors at LBA = 0x12efc1b2 = 317702578 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 08 00 00 12 ef c1 b0 e0 00 00:30:24.500 READ DMA EXT 35 00 00 00 08 00 00 00 fa 47 f8 e0 00 00:30:24.500 WRITE DMA EXT 25 00 00 00 20 00 00 00 a9 05 c0 e0 00 00:30:24.500 READ DMA EXT 25 00 00 00 08 00 00 12 ef c1 a8 e0 00 00:30:24.500 READ DMA EXT 35 00 00 00 08 00 00 00 fa 48 08 e0 00 00:30:24.500 WRITE DMA EXT Error 365 [0] occurred at disk power-on lifetime: 3572 hours (148 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 0e 00 00 12 ef c1 b2 e2 00 Error: UNC 14 sectors at LBA = 0x12efc1b2 = 317702578 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 20 00 00 12 ef c1 a0 e0 00 00:30:20.200 READ DMA EXT 35 00 00 00 08 00 00 12 ef c1 08 e0 00 00:30:20.200 WRITE DMA EXT 25 00 00 00 08 00 00 13 9e cd 38 e0 00 00:30:20.200 READ DMA EXT 35 00 00 00 08 00 00 12 ef c0 70 e0 00 00:30:20.200 WRITE DMA EXT 35 00 00 00 08 00 00 12 ef be e8 e0 00 00:30:20.200 WRITE DMA EXT Error 364 [3] occurred at disk power-on lifetime: 3570 hours (148 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 06 00 00 12 ef c1 b2 e2 00 Error: UNC 6 sectors at LBA = 0x12efc1b2 = 317702578 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 08 00 00 12 ef c1 b0 e0 00 00:24:30.300 READ DMA EXT 25 00 00 00 08 00 00 12 ef c1 a8 e0 00 00:24:30.300 READ DMA EXT 25 00 00 00 08 00 00 12 ef c1 a0 e0 00 00:24:30.300 READ DMA EXT 35 00 00 00 10 00 00 20 af 02 20 e0 00 00:24:30.200 WRITE DMA EXT 35 00 00 00 10 00 00 20 ae ff a0 e0 00 00:24:30.200 WRITE DMA EXT Error 363 [2] occurred at disk power-on lifetime: 3570 hours (148 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 2e 00 00 12 ef c1 b2 e2 00 Error: UNC 46 sectors at LBA = 0x12efc1b2 = 317702578 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 40 00 00 12 ef c1 a0 e0 00 00:24:25.900 READ DMA EXT 35 00 00 00 10 00 00 1e cc b4 40 e0 00 00:24:25.900 WRITE DMA EXT 35 00 00 00 20 00 00 13 30 aa 40 e0 00 00:24:25.900 WRITE DMA EXT 35 00 00 00 e0 00 00 13 58 10 80 e0 00 00:24:25.900 WRITE DMA EXT 35 00 00 01 00 00 00 13 58 0f 80 e0 00 00:24:25.900 WRITE DMA EXT SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: SMART Off-line Data Collection executing in background (4) Current Temperature: 37 Celsius Power Cycle Min/Max Temperature: 36/40 Celsius Lifetime Min/Max Temperature: 6/48 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -40/70 Celsius Temperature History Size (Index): 128 (88) Index Estimated Time Temperature Celsius 89 2016-12-21 19:23 37 ****************** 90 2016-12-21 19:24 37 ****************** 91 2016-12-21 19:25 38 ******************* ... ..( 10 skipped). .. ******************* 102 2016-12-21 19:36 38 ******************* 103 2016-12-21 19:37 39 ******************** ... ..( 34 skipped). .. ******************** 10 2016-12-21 20:12 39 ******************** 11 2016-12-21 20:13 38 ******************* ... ..( 6 skipped). .. ******************* 18 2016-12-21 20:20 38 ******************* 19 2016-12-21 20:21 39 ******************** 20 2016-12-21 20:22 38 ******************* ... ..( 12 skipped). .. ******************* 33 2016-12-21 20:35 38 ******************* 34 2016-12-21 20:36 37 ****************** ... ..( 40 skipped). .. ****************** 75 2016-12-21 21:17 37 ****************** 76 2016-12-21 21:18 36 ***************** ... ..( 2 skipped). .. ***************** 79 2016-12-21 21:21 36 ***************** 80 2016-12-21 21:22 37 ****************** ... ..( 7 skipped). .. ****************** 88 2016-12-21 21:30 37 ****************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 7 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS /dev/sdb === START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST340014A Serial Number: -- Firmware Version: 3.06 User Capacity: 40 020 664 320 bytes [40,0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 2 Local Time is: Wed Dec 21 21:30:04 2016 CXT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 31) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 062 054 006 - 1251459 3 Spin_Up_Time PO---- 098 098 000 - 0 4 Start_Stop_Count -O--CK 100 100 020 - 16 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0 7 Seek_Error_Rate POSR-- 088 060 030 - 730422185 9 Power_On_Hours -O--CK 079 079 000 - 18814 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 096 096 020 - 4810 194 Temperature_Celsius -O---K 035 046 000 - 35 195 Hardware_ECC_Recovered -O-RC- 062 054 000 - 1251459 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported