/dev/nvme0n1 smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.7.9-zen1-1-zen] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: WDC PC SN520 SDAPNUW-256G-1002 Serial Number: -- Firmware Version: 20110000 PCI Vendor/Subsystem ID: 0x15b7 IEEE OUI Identifier: 0x001b44 Total NVM Capacity: 256,060,514,304 [256 GB] Unallocated NVM Capacity: 0 Controller ID: 1 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 256,060,514,304 [256 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 001b44 ... Local Time is: Wed Mar 13 11:35:37 2024 +03 Firmware Updates (0x14): 2 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x001f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Log Page Attributes (0x02): Cmd_Eff_Lg Maximum Data Transfer Size: 128 Pages Warning Comp. Temp. Threshold: 82 Celsius Critical Comp. Temp. Threshold: 86 Celsius Namespace 1 Features (0x02): NA_Fields Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 2.60W - - 0 0 0 0 0 0 1 + 2.60W - - 1 1 1 1 0 0 2 + 1.70W - - 2 2 2 2 0 0 3 - 0.0250W - - 3 3 3 3 5000 9000 4 - 0.0025W - - 4 4 4 4 5000 44000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 2 1 - 4096 0 1 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 50 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 14% Data Units Read: 86,838,713 [44.4 TB] Data Units Written: 56,624,014 [28.9 TB] Host Read Commands: 942,669,344 Host Write Commands: 754,101,799 Controller Busy Time: 2,691 Power Cycles: 6,246 Power On Hours: 11,589 Unsafe Shutdowns: 758 Media and Data Integrity Errors: 0 Error Information Log Entries: 70 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Error Information (NVMe Log 0x01, 16 of 256 entries) No Errors Logged Read Self-test Log failed: Invalid Field in Command (0x4002) /dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.7.9-zen1-1-zen] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron Client SSDs Device Model: CT480BX500SSD1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: M6CR054 User Capacity: 480,103,981,056 bytes [480 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Mar 13 11:35:37 2024 +03 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0 5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 4539 12 Power_Cycle_Count -O--CK 100 100 000 - 2570 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Ave_Block-Erase_Count -O--CK 097 097 000 - 36 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 362 180 Unused_Reserve_NAND_Blk PO--CK 100 100 000 - 19 183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0 184 Error_Correction_Count -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 063 046 000 - 37 (Min/Max 19/54) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_ECC_Cnt -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 4 202 Percent_Lifetime_Remain ----CK 097 097 001 - 3 206 Write_Error_Rate -OSR-- 100 100 000 - 0 210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0 246 Total_LBAs_Written -O--CK 100 100 000 - 19555545612 247 Host_Program_Page_Count -O--CK 100 100 000 - 611110800 248 FTL_Program_Page_Count -O--CK 100 100 000 - 524311744 249 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 0 251 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 2697417858 252 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 6 253 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 254 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 116 223 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 4 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 5 Device-to-host register FISes sent due to a COMRESET