/dev/nvme0n1 smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.5-200.fc41.x86_64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: WDC PC SN520 SDAPNUW-512G-1032 Serial Number: -- Firmware Version: 20140000 PCI Vendor/Subsystem ID: 0x15b7 IEEE OUI Identifier: 0x001b44 Total NVM Capacity: 512,110,190,592 [512 GB] Unallocated NVM Capacity: 0 Controller ID: 1 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 512,110,190,592 [512 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 001b44 ... Local Time is: Sun Dec 29 20:31:57 2024 +10 Firmware Updates (0x14): 2 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x001f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Log Page Attributes (0x02): Cmd_Eff_Lg Maximum Data Transfer Size: 128 Pages Warning Comp. Temp. Threshold: 82 Celsius Critical Comp. Temp. Threshold: 86 Celsius Namespace 1 Features (0x02): NA_Fields Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 3.00W - - 0 0 0 0 0 0 1 + 2.60W - - 1 1 1 1 0 0 2 + 1.70W - - 2 2 2 2 0 0 3 - 0.0250W - - 3 3 3 3 5000 9000 4 - 0.0025W - - 4 4 4 4 5000 44000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 2 1 - 4096 0 1 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 44 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 4% Data Units Read: 51,693,479 [26.4 TB] Data Units Written: 49,781,264 [25.4 TB] Host Read Commands: 666,124,872 Host Write Commands: 778,625,323 Controller Busy Time: 1,704 Power Cycles: 2,999 Power On Hours: 11,642 Unsafe Shutdowns: 67 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Error Information (NVMe Log 0x01, 16 of 256 entries) No Errors Logged Read Self-test Log failed: Invalid Field in Command (0x4002) /dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.5-200.fc41.x86_64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 850 PRO 2TB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXM04B6Q User Capacity: 2,048,408,248,320 bytes [2.04 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Dec 29 20:31:57 2024 +10 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 600) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 099 099 010 - 17 9 Power_On_Hours -O--CK 091 091 000 - 40820 12 Power_Cycle_Count -O--CK 097 097 000 - 2169 177 Wear_Leveling_Count PO--C- 090 090 000 - 194 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 17 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 099 099 010 - 17 187 Uncorrectable_Error_Cnt -O--CK 099 099 000 - 1033 190 Airflow_Temperature_Cel -O--CK 062 036 000 - 38 195 ECC_Error_Rate -O-RC- 199 199 000 - 1033 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 172 241 Total_LBAs_Written -O--CK 099 099 000 - 278161524358 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 1033 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1033 [0] occurred at disk power-on lifetime: 11120 hours (463 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 51 01 00 00 00 25 5a 5e 28 e0 00 Error: 256 sectors at LBA = 0x255a5e28 = 626679336 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 01 00 00 00 25 5a 5d 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5c 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5b 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5a 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 59 28 e0 00 11d+09:24:37.000 READ DMA EXT Error 1032 [3] occurred at disk power-on lifetime: 11120 hours (463 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 51 01 00 00 00 25 5a 5e 28 e0 00 Error: 256 sectors at LBA = 0x255a5e28 = 626679336 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 01 00 00 00 25 5a 5d 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5c 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5b 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5a 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 59 28 e0 00 11d+09:24:37.000 READ DMA EXT Error 1031 [2] occurred at disk power-on lifetime: 11120 hours (463 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 51 01 00 00 00 25 5a 5e 28 e0 00 Error: 256 sectors at LBA = 0x255a5e28 = 626679336 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 01 00 00 00 25 5a 5d 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5c 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5b 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5a 28 e0 00 11d+09:24:37.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 59 28 e0 00 11d+09:24:37.000 READ DMA EXT Error 1030 [1] occurred at disk power-on lifetime: 11072 hours (461 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 51 01 00 00 00 25 5a 5e 28 e0 00 Error: 256 sectors at LBA = 0x255a5e28 = 626679336 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 01 00 00 00 25 5a 5d 28 e0 00 9d+09:30:06.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5c 28 e0 00 9d+09:30:06.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5b 28 e0 00 9d+09:30:06.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 5a 28 e0 00 9d+09:30:06.000 READ DMA EXT 25 00 00 01 00 00 00 25 5a 59 28 e0 00 9d+09:30:06.000 READ DMA EXT SMART Extended Self-test Log Version: 0 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 1 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 38 Celsius Power Cycle Min/Max Temperature: 31/41 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 937291889/144441344 SMART Status: 0x6478 (Reserved) SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (39) Index Estimated Time Temperature Celsius 40 2024-12-28 23:20 ? - ... ..( 86 skipped). .. - 127 2024-12-29 13:50 ? - 0 2024-12-29 14:00 31 ************ 1 2024-12-29 14:10 35 **************** 2 2024-12-29 14:20 37 ****************** 3 2024-12-29 14:30 38 ******************* 4 2024-12-29 14:40 40 ********************* 5 2024-12-29 14:50 40 ********************* 6 2024-12-29 15:00 41 ********************** ... ..( 4 skipped). .. ********************** 11 2024-12-29 15:50 41 ********************** 12 2024-12-29 16:00 40 ********************* 13 2024-12-29 16:10 38 ******************* ... ..( 25 skipped). .. ******************* 39 2024-12-29 20:30 38 ******************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 21 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC