Probe #ef447ee546 of Lenovo ThinkPad T440s 20AQC...

Log: smartctl

/dev/sda smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.8.9-101.fc31.x86_64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Intel 520 Series SSDs Device Model: INTEL SSDSC2CW240A3 Serial Number: -- LU WWN Device Id: 5 001517 ... Firmware Version: 400i User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Sep 23 10:26:42 2020 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Disabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2097) seconds. Offline data collection capabilities: (0x7f) SMART execute Offline immediate. Auto Offline data collection on/off support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0021) SCT Status supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0 9 Power_On_Hours_and_Msec -O--CK 000 000 000 - 915134h+58m+39.240s 12 Power_Cycle_Count -O--CK 092 092 000 - 8686 170 Available_Reservd_Space PO--CK 100 100 010 - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 545 184 End-to-End_Error PO--CK 100 100 090 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 545 225 Host_Writes_32MiB -O--CK 100 100 000 - 1550782 226 Workld_Media_Wear_Indic -O--CK 100 100 000 - 65535 227 Workld_Host_Reads_Perc -O--CK 100 100 000 - 43 228 Workload_Minutes -O--CK 100 100 000 - 65535 232 Available_Reservd_Space PO--CK 100 100 010 - 0 233 Media_Wearout_Indicator -O--CK 100 100 000 - 0 241 Host_Writes_32MiB -O--CK 100 100 000 - 1550782 242 Host_Reads_32MiB -O--CK 100 100 000 - 1189385 249 NAND_Writes_1GiB PO--C- 100 100 000 - 34933 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x04 GPL,SL R/O 1 Device Statistics log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xb7 GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 0 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 0 (0x0000) Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 30/30 Celsius Lifetime Min/Max Temperature: 30/30 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 0 (Unknown, should be 2) Temperature Sampling Period: 0 minutes Temperature Logging Interval: 0 minutes Min/Max recommended Temperature: 0/ 0 Celsius Min/Max Temperature Limit: 0/ 0 Celsius Temperature History Size (Index): 0 (0) Temperature History is empty SCT Error Recovery Control command not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 8693 --- Lifetime Power-On Resets 0x01 0x010 4 20339 --- Power-on Hours 0x01 0x018 6 101839594868 --- Logical Sectors Written 0x01 0x028 6 78132320725 --- Logical Sectors Read 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 26637 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 26637 --- Number of Hardware Resets 0x06 0x010 4 20510 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 255 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC 0x0002 2 0 R_ERR response for data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS /dev/sdb smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.8.9-101.fc31.x86_64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: TS256GMTS400S Serial Number: -- Firmware Version: P1225CH4 User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Sep 23 10:26:43 2020 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x71) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 1) minutes. Conveyance self-test routine recommended polling time: ( 1) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate ------ 100 100 000 - 0 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 9 Power_On_Hours ------ 100 100 000 - 3809 12 Power_Cycle_Count ------ 100 100 000 - 2415 160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0 161 Valid_Spare_Block_Cnt ------ 100 100 000 - 69 163 Initial_Bad_Block_Count ------ 100 100 000 - 21 164 Total_Erase_Count ------ 100 100 000 - 60064 165 Max_Erase_Count ------ 100 100 000 - 115 166 Min_Erase_Count ------ 100 100 000 - 13 167 Average_Erase_Count ------ 100 100 000 - 57 168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000 169 Remaining_Lifetime_Perc ------ 100 100 000 - 99 175 Program_Fail_Count_Chip ------ 100 100 000 - 0 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0 177 Wear_Leveling_Count ------ 100 100 050 - 98 178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0 182 Erase_Fail_Count_Total ------ 100 100 000 - 0 192 Power-Off_Retract_Count ------ 100 100 000 - 24 194 Temperature_Celsius ------ 100 100 000 - 21 195 Hardware_ECC_Recovered ------ 100 100 000 - 353 196 Reallocated_Event_Count ------ 100 100 016 - 0 197 Current_Pending_Sector ------ 100 100 000 - 0 198 Offline_Uncorrectable ------ 100 100 000 - 0 199 UDMA_CRC_Error_Count ------ 100 100 050 - 0 232 Available_Reservd_Space ------ 100 100 000 - 100 241 Host_Writes_32MiB ------ 100 100 000 - 252888 242 Host_Reads_32MiB ------ 100 100 000 - 278409 245 TLC_Writes_32MiB ------ 100 100 000 - 480512 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 3200 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 7 0 65535 Read_scanning was completed without error Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 2415 --- Lifetime Power-On Resets 0x01 0x010 4 3809 --- Power-on Hours 0x01 0x018 6 16573292353 --- Logical Sectors Written 0x01 0x020 6 136795565 --- Number of Write Commands 0x01 0x028 6 18245862691 --- Logical Sectors Read 0x01 0x030 6 360996146 --- Number of Read Commands 0x02 ===== = = === == Free-Fall Statistics (empty) == 0x03 ===== = = === == Rotating Media Statistics (empty) == 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 24 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (empty) == 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 1102 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported /dev/sdc smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.8.9-101.fc31.x86_64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SanDisk based SSDs Device Model: SanDisk SSD U110 16GB Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: U21B001 User Capacity: 16,013,942,784 bytes [16.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Sep 23 10:26:43 2020 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 3) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 716 12 Power_Cycle_Count -O---- 100 100 000 - 8421 171 Program_Fail_Count -O---- 100 100 000 - 0 172 Erase_Fail_Count -O---- 100 100 000 - 0 173 Avg_Write/Erase_Count -O---- 100 100 000 - 2076 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 164 187 Reported_Uncorrect -O---- 100 100 000 - 0 230 Perc_Write/Erase_Count -O---- 100 100 000 - 6920 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 834 241 Total_LBAs_Written -O---- 100 100 000 - 5137979758 242 Total_LBAs_Read -O---- 100 100 000 - 2827598355 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 706 - # 2 Short offline Aborted by host 20% 585 - SMART Selective self-test log data structure revision number 65535 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 18446744073709551615 18446744073709551615 Not_testing 2 18446744073709551615 18446744073709551615 Not_testing 3 18446744073709551615 18446744073709551615 Not_testing 4 18446744073709551615 18446744073709551615 Not_testing 5 18446744073709551615 18446744073709551615 Not_testing 65535 18446744073709551615 65534 Read_scanning was never started Selective self-test flags (0xffff): Currently read-scanning the remainder of the disk. If Selective self-test is pending on power-up, resume after 65535 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 21 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 54 --- Highest Temperature 0x05 0x028 1 15 --- Lowest Temperature 0x05 0x030 1 - --- Highest Average Short Term Temperature 0x05 0x038 1 - --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 69 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 18 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error


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